The NanoWizard Ultra Speed AFM system sets the new standard in terms of resolution paired with scan speed. The optimised cantilever deflection detection system comes with lowest noise level of today’s AFM’s. The fast electronics with highest bandwidth as well as the rigid mechanics and the newly designed high-voltage amplifiers deliver most accurate force control even on delicate sample structures.
To see dynamics in-situ with the highest spatial resolution is a current challenge for AFM. With the NanoWizard Ultra Speed AFM combined with standard inverted optical microscopy with condenser optics, fast scanning in-situ AFM experiments are now possible.
Features:-
- Fast scanning >300Hz line rate in air and liquid with excellent resolution
- Atomic resolution in closed-loop mode by lowest scanner, position-sensor and detection-system noise level
- Comes with the easy-to-use QI mode for quantitative material property mapping
- Unique integration with optical microscopy by tip-scanning design and patented DirectOverlay mode for most precise correlative microscopy
- Comprehensive force measurements from single molecules to living cells
- Highest flexibility and upgradeability with a broad range of modes and accessories
Applications:-
- Scientific/Laboratory Research
- Bio Physics
- Atomic Force Microscopy
- Atomic Force Microscopy combined with FLIM, FRAP, TIRF, FRET, Super-Resolution, Confocal