Scitech introduces Nanosurf’s latest atomic force microscope system, the NaioAFM, combining a compact AFM and its controller integrated in a single unit.
The atomic force microscope’s compact footprint allows quicker setup with less cables and plugs, and no loose parts, without any adjustment of components or alignment of laser required.
The NaioAFM integrates scan head, controller, video camera, XY-stage, airflow protection, and anti-vibration isolation in a single device. The user can begin operation by simply connecting the power supply and USB cable, and placing a sample to start exploring the Nanoworld using contact mode, dynamic mode, phase contrast and many more functions.
Ideal for Nanoeducation in material science, engineering, physics and chemistry, NaioAFM atomic force microscope presents a user-friendly entry level instrument for roughness measurement, defect analysis, surface coating and quality control on small samples.