National Instruments has announced open registration for the 2012 NI Technical Symposiums, the company’s free annual professional development conference series for test, control and embedded design.
Events will be held in Adelaide, Brisbane, Auckland, Sydney and Melbourne during the period of February-March 2012.
Each Symposium features six or more technical presentations, live demonstrations, interactive demo stations, exhibition areas, certification exams, guest presentations and the opportunity to learn more about new products and emerging technologies for embedded design, control and test.
Topics on the agenda for the 2012 events include:
- Software Development: Sessions dedicated to software development for measurement and control applications.
- Embedded Control and Monitoring: Gain an understanding of how to integrate measurements and control into an embedded device.
- Automated Test and Data Acquisition: New and advanced hardware and software tools including real-time and FPGA technology.
- RF & Wireless: Learn about next generation RF and wireless test technology.
- Hear from Industry Experts: industry engineers and academics discuss their applications and challenges they face.
The 2012 NI Technical Symposiums will also feature an exhibition area and several guest presentations.
Expected to attract well over 500 registrations in total across Australia and New Zealand, 2012 events will feature at the following dates and locations:
- Tuesday 21 February – Adelaide
- Thursday 23 February - Brisbane
- Wednesday 29 February - Auckland
- Tuesday 6 March – Sydney
- Thursday 8 March – Melbourne
Admission to the 2012 NI Technical Symposiums is free, but space is limited so early registration is recommended. Those wishing to register have several options:
- Visit australia.ni.com/techsym
- Australia: Freecall 1800 300 800 or New Zealand: Freecall 0800 553 322
- Send an e-mail to info.australia@ni.com with their contact information